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BibTeX record journals/mr/TajalliMRMBZM17
@article{DBLP:journals/mr/TajalliMRMBZM17, author = {Alaleh Tajalli and Matteo Meneghini and Isabella Rossetto and Peter Moens and Abhishek Banerjee and Enrico Zanoni and Gaudenzio Meneghesso}, title = {Field and hot electron-induced degradation in GaN-based power MIS-HEMTs}, journal = {Microelectron. Reliab.}, volume = {76-77}, pages = {282--286}, year = {2017}, url = {https://doi.org/10.1016/j.microrel.2017.06.021}, doi = {10.1016/J.MICROREL.2017.06.021}, timestamp = {Tue, 07 May 2024 20:21:53 +0200}, biburl = {https://dblp.org/rec/journals/mr/TajalliMRMBZM17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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