BibTeX record journals/mr/TachiBKICE11

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@article{DBLP:journals/mr/TachiBKICE11,
  author    = {Kiichi Tachi and
               Sylvain Barraud and
               Kuniyuki Kakushima and
               Hiroshi Iwai and
               Sorin Cristoloveanu and
               Thomas Ernst},
  title     = {Comparison of low-temperature electrical characteristics of gate-all-around
               nanowire FETs, Fin FETs and fully-depleted {SOI} FETs},
  journal   = {Microelectron. Reliab.},
  volume    = {51},
  number    = {5},
  pages     = {885--888},
  year      = {2011},
  url       = {https://doi.org/10.1016/j.microrel.2011.01.004},
  doi       = {10.1016/j.microrel.2011.01.004},
  timestamp = {Sat, 22 Feb 2020 19:27:51 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/TachiBKICE11.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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