BibTeX record journals/mr/ShickovaKVAHMGK07

download as .bib file

@article{DBLP:journals/mr/ShickovaKVAHMGK07,
  author       = {A. Shickova and
                  Ben Kaczer and
                  Anabela Veloso and
                  Marc Aoulaiche and
                  M. Houssa and
                  Herman E. Maes and
                  Guido Groeseneken and
                  J. A. Kittl},
  title        = {{NBTI} reliability of Ni FUSI/HfSiON gates: Effect of silicide phase},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {4-5},
  pages        = {505--507},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.01.046},
  doi          = {10.1016/J.MICROREL.2007.01.046},
  timestamp    = {Tue, 31 Oct 2023 07:48:39 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ShickovaKVAHMGK07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.