BibTeX record journals/mr/SharmaTWRREPCG15

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@article{DBLP:journals/mr/SharmaTWRREPCG15,
  author       = {Prateek Sharma and
                  Stanislav Tyaginov and
                  Yannick Wimmer and
                  Florian Rudolf and
                  Karl Rupp and
                  Hubert Enichlmair and
                  J. H. Park and
                  Hajdin Ceric and
                  Tibor Grasser},
  title        = {Comparison of analytic distribution function models for hot-carrier
                  degradation modeling in nLDMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1427--1432},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.021},
  doi          = {10.1016/J.MICROREL.2015.06.021},
  timestamp    = {Thu, 14 Oct 2021 09:38:49 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/SharmaTWRREPCG15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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