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BibTeX record journals/mr/SharmaTWRREPCG15
@article{DBLP:journals/mr/SharmaTWRREPCG15, author = {Prateek Sharma and Stanislav Tyaginov and Yannick Wimmer and Florian Rudolf and Karl Rupp and Hubert Enichlmair and J. H. Park and Hajdin Ceric and Tibor Grasser}, title = {Comparison of analytic distribution function models for hot-carrier degradation modeling in nLDMOSFETs}, journal = {Microelectron. Reliab.}, volume = {55}, number = {9-10}, pages = {1427--1432}, year = {2015}, url = {https://doi.org/10.1016/j.microrel.2015.06.021}, doi = {10.1016/J.MICROREL.2015.06.021}, timestamp = {Thu, 14 Oct 2021 09:38:49 +0200}, biburl = {https://dblp.org/rec/journals/mr/SharmaTWRREPCG15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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