BibTeX record journals/mr/SharmaTWRREPCG15

download as .bib file

@article{DBLP:journals/mr/SharmaTWRREPCG15,
  author    = {Prateek Sharma and
               Stanislav Tyaginov and
               Yannick Wimmer and
               Florian Rudolf and
               Karl Rupp and
               Hubert Enichlmair and
               J. H. Park and
               Hajdin Ceric and
               Tibor Grasser},
  title     = {Comparison of analytic distribution function models for hot-carrier
               degradation modeling in nLDMOSFETs},
  journal   = {Microelectron. Reliab.},
  volume    = {55},
  number    = {9-10},
  pages     = {1427--1432},
  year      = {2015},
  url       = {https://doi.org/10.1016/j.microrel.2015.06.021},
  doi       = {10.1016/j.microrel.2015.06.021},
  timestamp = {Sat, 22 Feb 2020 19:29:16 +0100},
  biburl    = {https://dblp.org/rec/journals/mr/SharmaTWRREPCG15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
a service of Schloss Dagstuhl - Leibniz Center for Informatics