BibTeX record journals/mr/SaitoN16

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@article{DBLP:journals/mr/SaitoN16,
  author       = {Wataru Saito and
                  Toshiyuki Naka},
  title        = {{UIS} test of high-voltage GaN-HEMTs with p-type gate structure},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {552--555},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.066},
  doi          = {10.1016/J.MICROREL.2016.07.066},
  timestamp    = {Sat, 22 Feb 2020 19:28:06 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SaitoN16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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