BibTeX record journals/mr/RuzzarinMSSPMZ18

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@article{DBLP:journals/mr/RuzzarinMSSPMZ18,
  author       = {Maria Ruzzarin and
                  Matteo Meneghini and
                  Carlo De Santi and
                  Min Sun and
                  Tom{\'{a}}s Palacios and
                  Gaudenzio Meneghesso and
                  Enrico Zanoni},
  title        = {Degradation of vertical GaN-on-GaN fin transistors: Step-stress and
                  constant voltage experiments},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {620--626},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.044},
  doi          = {10.1016/J.MICROREL.2018.06.044},
  timestamp    = {Tue, 07 May 2024 20:21:52 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/RuzzarinMSSPMZ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}