BibTeX record journals/mr/OhKKBLLKC16

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@article{DBLP:journals/mr/OhKKBLLKC16,
  author       = {Wonwook Oh and
                  Junhee Kim and
                  Byungjun Kang and
                  Soo Hyun Bae and
                  Kyung Dong Lee and
                  Hae{-}Seok Lee and
                  Donghwan Kim and
                  Sung{-}Il Chan},
  title        = {Evaluation of potential-induced degradation in crystalline Si solar
                  cells using Na fault injection},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {646--649},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.059},
  doi          = {10.1016/J.MICROREL.2016.07.059},
  timestamp    = {Sat, 22 Feb 2020 19:28:27 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/OhKKBLLKC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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