BibTeX record journals/mr/NaumannGBA16

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@article{DBLP:journals/mr/NaumannGBA16,
  author       = {Falk Naumann and
                  Volkmar Gottschalk and
                  Bernd Burchard and
                  Frank Altmann},
  title        = {Reliability evaluation of Si-dies due to assembly issues},
  journal      = {Microelectron. Reliab.},
  volume       = {64},
  pages        = {266--269},
  year         = {2016},
  url          = {https://doi.org/10.1016/j.microrel.2016.07.065},
  doi          = {10.1016/J.MICROREL.2016.07.065},
  timestamp    = {Wed, 23 Mar 2022 09:35:31 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/NaumannGBA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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