BibTeX record journals/mr/MukherjeeJCZBAM17

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@article{DBLP:journals/mr/MukherjeeJCZBAM17,
  author       = {C. Mukherjee and
                  Thomas Jacquet and
                  Anjan Chakravorty and
                  Thomas Zimmer and
                  Josef Boeck and
                  Klaus Aufinger and
                  Cristell Maneux},
  title        = {Random telegraph noise in SiGe HBTs: Reliability analysis close to
                  {SOA} limit},
  journal      = {Microelectron. Reliab.},
  volume       = {73},
  pages        = {146--152},
  year         = {2017},
  url          = {https://doi.org/10.1016/j.microrel.2017.05.001},
  doi          = {10.1016/J.MICROREL.2017.05.001},
  timestamp    = {Wed, 31 Aug 2022 16:10:19 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/MukherjeeJCZBAM17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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