BibTeX record journals/mr/LeiGTZZCEHCP18

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@article{DBLP:journals/mr/LeiGTZZCEHCP18,
  author       = {Zhifeng Lei and
                  H. X. Guo and
                  M. H. Tang and
                  C. Zeng and
                  Zhangang Zhang and
                  H. Chen and
                  Y. F. En and
                  Y. Huang and
                  Yiqiang Chen and
                  Chao Peng},
  title        = {Degradation mechanisms of AlGaN/GaN HEMTs under 800 MeV Bi ions irradiation},
  journal      = {Microelectron. Reliab.},
  volume       = {80},
  pages        = {312--316},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2017.07.086},
  doi          = {10.1016/J.MICROREL.2017.07.086},
  timestamp    = {Sun, 30 Jul 2023 10:28:02 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/LeiGTZZCEHCP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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