BibTeX record journals/mr/KimKYC04

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@article{DBLP:journals/mr/KimKYC04,
  author    = {K. S. Kim and
               H. I. Kim and
               C. H. Yu and
               E. G. Chang},
  title     = {Fatigue analysis of high-speed photodiode submodule by using {FEM}},
  journal   = {Microelectronics Reliability},
  volume    = {44},
  number    = {1},
  pages     = {167--171},
  year      = {2004},
  url       = {https://doi.org/10.1016/j.microrel.2003.07.001},
  doi       = {10.1016/j.microrel.2003.07.001},
  timestamp = {Sun, 28 May 2017 13:23:38 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/KimKYC04},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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