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BibTeX record journals/mr/KimKL04
@article{DBLP:journals/mr/KimKL04, author = {Kyungmee O. Kim and Way Kuo and Wen Luo}, title = {A relation model of gate oxide yield and reliability}, journal = {Microelectron. Reliab.}, volume = {44}, number = {3}, pages = {425--434}, year = {2004}, url = {https://doi.org/10.1016/j.microrel.2003.09.009}, doi = {10.1016/J.MICROREL.2003.09.009}, timestamp = {Sat, 22 Feb 2020 19:26:59 +0100}, biburl = {https://dblp.org/rec/journals/mr/KimKL04.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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