BibTeX record journals/mr/KimCPCJ18

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@article{DBLP:journals/mr/KimCPCJ18,
  author       = {Dongshin Kim and
                  Ju{-}Hwan Choi and
                  Nochang Park and
                  Sung{-}Il Chan and
                  Yongchae Jeong},
  title        = {Analysis of semiconductor fault using {DS} (damped sinusoidal) {HPEM}
                  injection},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {411--417},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.07.117},
  doi          = {10.1016/J.MICROREL.2018.07.117},
  timestamp    = {Thu, 14 Oct 2021 09:38:38 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/KimCPCJ18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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