BibTeX record journals/mr/JangPILMS08

download as .bib file

@article{DBLP:journals/mr/JangPILMS08,
  author       = {Changsoo Jang and
                  Seungbae Park and
                  Bill Infantolino and
                  Lawrence Lehman and
                  Ryan Morgan and
                  Dipak Sengupta},
  title        = {Failure analysis of contact probe pins for SnPb and Sn applications},
  journal      = {Microelectron. Reliab.},
  volume       = {48},
  number       = {6},
  pages        = {942--947},
  year         = {2008},
  url          = {https://doi.org/10.1016/j.microrel.2008.03.015},
  doi          = {10.1016/J.MICROREL.2008.03.015},
  timestamp    = {Sat, 22 Feb 2020 19:27:24 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/JangPILMS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.