BibTeX record journals/mr/JangKYKCP07

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@article{DBLP:journals/mr/JangKYKCP07,
  author       = {Sung Jun Jang and
                  Dae Hyun Ka and
                  Chong{-}Gun Yu and
                  Kwan{-}Su Kim and
                  Won{-}Ju Cho and
                  Jong Tae Park},
  title        = {Comparative study of {NBTI} as a function of Si film orientation and
                  thickness in {SOI} pMOSFETs},
  journal      = {Microelectron. Reliab.},
  volume       = {47},
  number       = {9-11},
  pages        = {1411--1415},
  year         = {2007},
  url          = {https://doi.org/10.1016/j.microrel.2007.07.015},
  doi          = {10.1016/J.MICROREL.2007.07.015},
  timestamp    = {Sun, 02 Oct 2022 15:44:01 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/JangKYKCP07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}