BibTeX record journals/mr/ForsterLJ03

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@article{DBLP:journals/mr/ForsterLJ03,
  author       = {St{\'{e}}phane Forster and
                  Thierry Lequeu and
                  Robert J{\'{e}}risian},
  title        = {Degradation mechanism of power devices under di/dt thermal shocks:
                  turn-on of a {TRIAC} in {Q3}},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {1},
  pages        = {89--98},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(02)00261-5},
  doi          = {10.1016/S0026-2714(02)00261-5},
  timestamp    = {Sat, 22 Feb 2020 19:28:12 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/ForsterLJ03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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