BibTeX record journals/mr/FadlallahPMGBSG03

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@article{DBLP:journals/mr/FadlallahPMGBSG03,
  author       = {M. Fadlallah and
                  C. Petit and
                  A. Meinertzhagen and
                  G{\'{e}}rard Ghibaudo and
                  M. Bidaud and
                  O. Simonetti and
                  F. Guyader},
  title        = {Influence of nitradation in ultra-thin oxide on the gate current degradation
                  of {N} and {PMOS} devices},
  journal      = {Microelectron. Reliab.},
  volume       = {43},
  number       = {9-11},
  pages        = {1433--1438},
  year         = {2003},
  url          = {https://doi.org/10.1016/S0026-2714(03)00255-5},
  doi          = {10.1016/S0026-2714(03)00255-5},
  timestamp    = {Sat, 22 Feb 2020 19:28:40 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/FadlallahPMGBSG03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}