BibTeX record journals/mr/DreherSVHAB18

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@article{DBLP:journals/mr/DreherSVHAB18,
  author    = {P. Dreher and
               Roman Schmidt and
               A. Vetter and
               J. Hepp and
               Karl Aberer and
               C. J. Brabec},
  title     = {Non-destructive imaging of defects in Ag-sinter die attach layers
               - {A} comparative study including X-ray, Scanning Acoustic Microscopy
               and Thermography},
  journal   = {Microelectronics Reliability},
  volume    = {88-90},
  pages     = {365--370},
  year      = {2018},
  url       = {https://doi.org/10.1016/j.microrel.2018.07.121},
  doi       = {10.1016/j.microrel.2018.07.121},
  timestamp = {Mon, 07 Jan 2019 12:04:19 +0100},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DreherSVHAB18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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