BibTeX record journals/mr/DoeringRPRWESWM14

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@article{DBLP:journals/mr/DoeringRPRWESWM14,
  author    = {Stefan Doering and
               Ralf Rudolf and
               Martin Pinkert and
               Hagen Roetz and
               Catejan Wagner and
               Stefan Eckl and
               Marc Strasser and
               Andre Wachowiak and
               Thomas Mikolajick},
  title     = {Scanning spreading resistance microscopy for failure analysis of nLDMOS
               devices with decreased breakdown voltage},
  journal   = {Microelectronics Reliability},
  volume    = {54},
  number    = {9-10},
  pages     = {2128--2132},
  year      = {2014},
  url       = {https://doi.org/10.1016/j.microrel.2014.07.021},
  doi       = {10.1016/j.microrel.2014.07.021},
  timestamp = {Wed, 14 Jun 2017 20:36:57 +0200},
  biburl    = {https://dblp.org/rec/bib/journals/mr/DoeringRPRWESWM14},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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