BibTeX record journals/mr/CaiWNZ15

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@article{DBLP:journals/mr/CaiWNZ15,
  author       = {Hao Cai and
                  You Wang and
                  Lirida A. B. Naviner and
                  W. S. Zhao},
  title        = {Ultra wide voltage range consideration of reliability-aware {STT}
                  magnetic flip-flop in 28 nm {FDSOI} technology},
  journal      = {Microelectron. Reliab.},
  volume       = {55},
  number       = {9-10},
  pages        = {1323--1327},
  year         = {2015},
  url          = {https://doi.org/10.1016/j.microrel.2015.06.023},
  doi          = {10.1016/J.MICROREL.2015.06.023},
  timestamp    = {Sun, 02 Oct 2022 15:43:59 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/CaiWNZ15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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