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BibTeX record journals/mr/CaiWNZ15
@article{DBLP:journals/mr/CaiWNZ15, author = {Hao Cai and You Wang and Lirida A. B. Naviner and W. S. Zhao}, title = {Ultra wide voltage range consideration of reliability-aware {STT} magnetic flip-flop in 28 nm {FDSOI} technology}, journal = {Microelectron. Reliab.}, volume = {55}, number = {9-10}, pages = {1323--1327}, year = {2015}, url = {https://doi.org/10.1016/j.microrel.2015.06.023}, doi = {10.1016/J.MICROREL.2015.06.023}, timestamp = {Sun, 02 Oct 2022 15:43:59 +0200}, biburl = {https://dblp.org/rec/journals/mr/CaiWNZ15.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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