BibTeX record journals/mr/BuonomoWLCC18

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@article{DBLP:journals/mr/BuonomoWLCC18,
  author       = {Marco Buonomo and
                  Nicola Wrachien and
                  Nicol{\`{o}} Lago and
                  Giuseppe Cantarella and
                  Andrea Cester},
  title        = {Effects of stair case gate bias stress in IGZO/Al\({}_{\mbox{2}}\)O\({}_{\mbox{3}}\)
                  flexible TFTs},
  journal      = {Microelectron. Reliab.},
  volume       = {88-90},
  pages        = {882--886},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.microrel.2018.06.056},
  doi          = {10.1016/J.MICROREL.2018.06.056},
  timestamp    = {Wed, 07 Dec 2022 23:04:38 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/BuonomoWLCC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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