BibTeX record journals/jetc/BarkeS15

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@article{DBLP:journals/jetc/BarkeS15,
  author       = {Martin Barke and
                  Ulf Schlichtmann},
  title        = {A Cross-Layer Approach to Measure the Robustness of Integrated Circuits},
  journal      = {{ACM} J. Emerg. Technol. Comput. Syst.},
  volume       = {12},
  number       = {3},
  pages        = {24:1--24:22},
  year         = {2015},
  url          = {https://doi.org/10.1145/2743022},
  doi          = {10.1145/2743022},
  timestamp    = {Mon, 08 Jun 2020 22:33:19 +0200},
  biburl       = {https://dblp.org/rec/journals/jetc/BarkeS15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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