BibTeX record journals/jcsc/KimHJKL91

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@article{DBLP:journals/jcsc/KimHJKL91,
  author       = {Yun{-}Hong Kim and
                  In{-}Sik Hong and
                  Jun{-}Mo Jung and
                  Young{-}Oo Kim and
                  In{-}Chil Lim},
  title        = {An Efficient Test Procedure for Functional Faults in semiconductor
                  Random Access Memories},
  journal      = {J. Circuits Syst. Comput.},
  volume       = {1},
  number       = {2},
  pages        = {229--238},
  year         = {1991},
  url          = {https://doi.org/10.1142/S0218126691000069},
  doi          = {10.1142/S0218126691000069},
  timestamp    = {Tue, 25 Aug 2020 16:57:10 +0200},
  biburl       = {https://dblp.org/rec/journals/jcsc/KimHJKL91.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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