BibTeX record journals/ieicet/YamadaSYIKKK10

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@article{DBLP:journals/ieicet/YamadaSYIKKK10,
  author       = {Kenta Yamada and
                  Toshiyuki Syo and
                  Hisao Yoshimura and
                  Masaru Ito and
                  Tatsuya Kunikiyo and
                  Toshiki Kanamoto and
                  Shigetaka Kumashiro},
  title        = {Exhaustive and Systematic Accuracy Verification and Enhancement of
                  {STI} Stress Compact Model for General Realistic Layout Patterns},
  journal      = {{IEICE} Trans. Electron.},
  volume       = {93-C},
  number       = {8},
  pages        = {1349--1358},
  year         = {2010},
  url          = {https://doi.org/10.1587/transele.E93.C.1349},
  doi          = {10.1587/TRANSELE.E93.C.1349},
  timestamp    = {Sat, 11 Apr 2020 14:47:54 +0200},
  biburl       = {https://dblp.org/rec/journals/ieicet/YamadaSYIKKK10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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