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BibTeX record journals/ieicet/HamanakaYFKKO11
@article{DBLP:journals/ieicet/HamanakaYFKKO11, author = {Chikara Hamanaka and Ryosuke Yamamoto and Jun Furuta and Kanto Kubota and Kazutoshi Kobayashi and Hidetoshi Onodera}, title = {Variation-Tolerance of a 65-nm Error-Hardened Dual-Modular-Redundancy Flip-Flop Measured by Shift-Register-Based Monitor Structures}, journal = {{IEICE} Trans. Fundam. Electron. Commun. Comput. Sci.}, volume = {94-A}, number = {12}, pages = {2669--2675}, year = {2011}, url = {https://doi.org/10.1587/transfun.E94.A.2669}, doi = {10.1587/TRANSFUN.E94.A.2669}, timestamp = {Sat, 11 Apr 2020 13:28:15 +0200}, biburl = {https://dblp.org/rec/journals/ieicet/HamanakaYFKKO11.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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