BibTeX record journals/ieiceee/YuYXY05

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@article{DBLP:journals/ieiceee/YuYXY05,
  author       = {Chuanzhao Yu and
                  Hong Yang and
                  Enjun Xiao and
                  J. S. Yuan},
  title        = {Voltage stress-induced performance degradation in {NMOSFET} mixer},
  journal      = {{IEICE} Electron. Express},
  volume       = {2},
  number       = {5},
  pages        = {133--137},
  year         = {2005},
  url          = {https://doi.org/10.1587/elex.2.133},
  doi          = {10.1587/ELEX.2.133},
  timestamp    = {Fri, 12 Feb 2021 22:21:10 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/YuYXY05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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