BibTeX record journals/ieiceee/KhanWB16a

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@article{DBLP:journals/ieiceee/KhanWB16a,
  author       = {Saqib A. Khan and
                  Shi{-}Jie Wen and
                  Sanghyeon Baeg},
  title        = {Erratum: Assessing alpha-particle-induced {SEU} sensitivity of flip-chip
                  bonded {SRAM} using high energy irradiation {[IEICE} Electronics Express
                  Vol. 13 {(2016)} No. 17 pp. 20160627]},
  journal      = {{IEICE} Electron. Express},
  volume       = {13},
  number       = {19},
  pages        = {20168001},
  year         = {2016},
  url          = {https://doi.org/10.1587/elex.13.20168001},
  doi          = {10.1587/ELEX.13.20168001},
  timestamp    = {Fri, 12 Feb 2021 22:21:56 +0100},
  biburl       = {https://dblp.org/rec/journals/ieiceee/KhanWB16a.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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