BibTeX record journals/et/WegenerK06

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@article{DBLP:journals/et/WegenerK06,
  author       = {Carsten Wegener and
                  Michael Peter Kennedy},
  title        = {Test Development Through Defect and Test Escape Level Estimation for
                  Data Converters},
  journal      = {J. Electron. Test.},
  volume       = {22},
  number       = {4-6},
  pages        = {313--324},
  year         = {2006},
  url          = {https://doi.org/10.1007/s10836-006-9457-y},
  doi          = {10.1007/S10836-006-9457-Y},
  timestamp    = {Fri, 11 Sep 2020 15:03:00 +0200},
  biburl       = {https://dblp.org/rec/journals/et/WegenerK06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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