BibTeX record journals/et/WaliDVBGR17

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@article{DBLP:journals/et/WaliDVBGR17,
  author       = {Imran Wali and
                  Bastien Deveautour and
                  Arnaud Virazel and
                  Alberto Bosio and
                  Patrick Girard and
                  Matteo Sonza Reorda},
  title        = {A Low-Cost Reliability vs. Cost Trade-Off Methodology to Selectively
                  Harden Logic Circuits},
  journal      = {J. Electron. Test.},
  volume       = {33},
  number       = {1},
  pages        = {25--36},
  year         = {2017},
  url          = {https://doi.org/10.1007/s10836-017-5640-6},
  doi          = {10.1007/S10836-017-5640-6},
  timestamp    = {Tue, 21 Mar 2023 21:13:44 +0100},
  biburl       = {https://dblp.org/rec/journals/et/WaliDVBGR17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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