BibTeX record journals/et/VrankenWFL02

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@article{DBLP:journals/et/VrankenWFL02,
  author    = {Harald P. E. Vranken and
               Tom Waayers and
               H{\'{e}}rv{\'{e}} Fleury and
               David Lelouvier},
  title     = {Enhanced Reduced Pin-Count Test for Full-Scan Design},
  journal   = {J. Electronic Testing},
  volume    = {18},
  number    = {2},
  pages     = {129--143},
  year      = {2002},
  url       = {https://doi.org/10.1023/A:1014989408897},
  doi       = {10.1023/A:1014989408897},
  timestamp = {Thu, 18 May 2017 09:51:14 +0200},
  biburl    = {https://dblp.org/rec/journals/et/VrankenWFL02.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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