BibTeX record journals/et/LuoWHC16

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@article{DBLP:journals/et/LuoWHC16,
  author       = {Kun{-}Lun Luo and
                  Ming{-}Hsueh Wu and
                  Chun{-}Lung Hsu and
                  Chen{-}An Chen},
  title        = {Built-In Self-Test Design for the 3D-Stacked Wide-I/O {DRAM}},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {2},
  pages        = {111--123},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5570-8},
  doi          = {10.1007/S10836-016-5570-8},
  timestamp    = {Fri, 11 Sep 2020 15:03:20 +0200},
  biburl       = {https://dblp.org/rec/journals/et/LuoWHC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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