BibTeX record journals/et/LiLWLWNMC15

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@article{DBLP:journals/et/LiLWLWNMC15,
  author    = {Lixiang Li and
               Yuanqing Li and
               Haibin Wang and
               Rui Liu and
               Qiong Wu and
               Michael Newton and
               Yuan Ma and
               Li Chen},
  title     = {Simulation and Experimental Evaluation of a Soft Error Tolerant Layout
               for {SRAM} 6T Bitcell in 65nm Technology},
  journal   = {J. Electronic Testing},
  volume    = {31},
  number    = {5-6},
  pages     = {561--568},
  year      = {2015},
  url       = {https://doi.org/10.1007/s10836-015-5549-x},
  doi       = {10.1007/s10836-015-5549-x},
  timestamp = {Sat, 13 Jun 2020 15:34:56 +0200},
  biburl    = {https://dblp.org/rec/journals/et/LiLWLWNMC15.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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