BibTeX record journals/et/IshidaNKKA16

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@article{DBLP:journals/et/IshidaNKKA16,
  author       = {Masahiro Ishida and
                  Toru Nakura and
                  Takashi Kusaka and
                  Satoshi Komatsu and
                  Kunihiro Asada},
  title        = {Dynamic Power Integrity Control of {ATE} for Eliminating Overkills
                  and Underkills in Device Testing},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {3},
  pages        = {257--271},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5582-4},
  doi          = {10.1007/S10836-016-5582-4},
  timestamp    = {Fri, 11 Sep 2020 15:03:08 +0200},
  biburl       = {https://dblp.org/rec/journals/et/IshidaNKKA16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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