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BibTeX record journals/et/IshidaNKKA16
@article{DBLP:journals/et/IshidaNKKA16, author = {Masahiro Ishida and Toru Nakura and Takashi Kusaka and Satoshi Komatsu and Kunihiro Asada}, title = {Dynamic Power Integrity Control of {ATE} for Eliminating Overkills and Underkills in Device Testing}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {257--271}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5582-4}, doi = {10.1007/S10836-016-5582-4}, timestamp = {Fri, 11 Sep 2020 15:03:08 +0200}, biburl = {https://dblp.org/rec/journals/et/IshidaNKKA16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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