BibTeX record journals/et/GoelM03

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@article{DBLP:journals/et/GoelM03,
  author    = {Sandeep Kumar Goel and
               Erik Jan Marinissen},
  title     = {A Test Time Reduction Algorithm for Test Architecture Design for Core-Based
               System Chips},
  journal   = {J. Electronic Testing},
  volume    = {19},
  number    = {4},
  pages     = {425--435},
  year      = {2003},
  url       = {https://doi.org/10.1023/A:1024644026761},
  doi       = {10.1023/A:1024644026761},
  timestamp = {Thu, 18 May 2017 09:51:14 +0200},
  biburl    = {https://dblp.org/rec/journals/et/GoelM03.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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