BibTeX record journals/et/CuiSW16

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@article{DBLP:journals/et/CuiSW16,
  author       = {Yiqian Cui and
                  Junyou Shi and
                  Zili Wang},
  title        = {Analog Circuit Test Point Selection Incorporating Discretization-Based
                  Fuzzification and Extended Fault Dictionary to Handle Component Tolerances},
  journal      = {J. Electron. Test.},
  volume       = {32},
  number       = {6},
  pages        = {661--679},
  year         = {2016},
  url          = {https://doi.org/10.1007/s10836-016-5620-2},
  doi          = {10.1007/S10836-016-5620-2},
  timestamp    = {Fri, 11 Sep 2020 15:02:46 +0200},
  biburl       = {https://dblp.org/rec/journals/et/CuiSW16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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