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BibTeX record journals/et/ChenWCLZLCL16
@article{DBLP:journals/et/ChenWCLZLCL16, author = {Qingyu Chen and Haibin Wang and Li Chen and Lixiang Li and Xing Zhao and Rui Liu and Mo Chen and Xuantian Li}, title = {An SEU-Resilient {SRAM} Bitcell in 65-nm {CMOS} Technology}, journal = {J. Electron. Test.}, volume = {32}, number = {3}, pages = {385--391}, year = {2016}, url = {https://doi.org/10.1007/s10836-016-5586-0}, doi = {10.1007/S10836-016-5586-0}, timestamp = {Wed, 26 Oct 2022 22:55:46 +0200}, biburl = {https://dblp.org/rec/journals/et/ChenWCLZLCL16.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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