BibTeX record journals/eswa/Lin09

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@article{DBLP:journals/eswa/Lin09,
  author       = {Hong{-}Dar Lin},
  title        = {Automated defect inspection of light-emitting diode chips using neural
                  network and statistical approaches},
  journal      = {Expert Syst. Appl.},
  volume       = {36},
  number       = {1},
  pages        = {219--226},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.eswa.2007.09.014},
  doi          = {10.1016/J.ESWA.2007.09.014},
  timestamp    = {Tue, 06 Jun 2017 22:26:09 +0200},
  biburl       = {https://dblp.org/rec/journals/eswa/Lin09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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