BibTeX record journals/dt/WangLWLCLPW17

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@article{DBLP:journals/dt/WangLWLCLPW17,
  author       = {Kai{-}Li Wang and
                  Bing{-}Yang Lin and
                  Cheng{-}Wen Wu and
                  Mincent Lee and
                  Hao Chen and
                  Hung{-}Chih Lin and
                  Ching{-}Nen Peng and
                  Min{-}Jer Wang},
  title        = {Test Cost Reduction Methodology for InFO Wafer-Level Chip-Scale Package},
  journal      = {{IEEE} Des. Test},
  volume       = {34},
  number       = {3},
  pages        = {50--58},
  year         = {2017},
  url          = {https://doi.org/10.1109/MDAT.2016.2562060},
  doi          = {10.1109/MDAT.2016.2562060},
  timestamp    = {Sat, 30 Sep 2023 10:11:54 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/WangLWLCLPW17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}