BibTeX record journals/dt/OoiSKCSDC13

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@article{DBLP:journals/dt/OoiSKCSDC13,
  author       = {Melanie Po{-}Leen Ooi and
                  Hong Kuan Sok and
                  Ye Chow Kuang and
                  Huiyuan Cheng and
                  Eric Kwang Joo Sim and
                  Serge N. Demidenko and
                  Chris W. K. Chan},
  title        = {Identifying Systematic Failures on Semiconductor Wafers Using {ADCAS}},
  journal      = {{IEEE} Des. Test},
  volume       = {30},
  number       = {5},
  pages        = {44--53},
  year         = {2013},
  url          = {https://doi.org/10.1109/MDAT.2013.2253151},
  doi          = {10.1109/MDAT.2013.2253151},
  timestamp    = {Sun, 02 Oct 2022 15:33:50 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/OoiSKCSDC13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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