BibTeX record journals/dt/LiangLC95

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@article{DBLP:journals/dt/LiangLC95,
  author       = {Hsing{-}Chung Liang and
                  Chung{-}Len Lee and
                  Jwu E. Chen},
  title        = {Identifying Untestable Faults in Sequential Circuits},
  journal      = {{IEEE} Des. Test Comput.},
  volume       = {12},
  number       = {3},
  pages        = {14--23},
  year         = {1995},
  url          = {https://doi.org/10.1109/MDT.1995.466367},
  doi          = {10.1109/MDT.1995.466367},
  timestamp    = {Tue, 07 Mar 2023 08:43:11 +0100},
  biburl       = {https://dblp.org/rec/journals/dt/LiangLC95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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