BibTeX record journals/dt/ChouLYLKC15

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@article{DBLP:journals/dt/ChouLYLKC15,
  author       = {Che{-}Wei Chou and
                  Jin{-}Fu Li and
                  Yun{-}Chao Yu and
                  Chih{-}Yen Lo and
                  Ding{-}Ming Kwai and
                  Yung{-}Fa Chou},
  title        = {Hierarchical Test Integration Methodology for 3-D ICs},
  journal      = {{IEEE} Des. Test},
  volume       = {32},
  number       = {4},
  pages        = {59--70},
  year         = {2015},
  url          = {https://doi.org/10.1109/MDAT.2015.2427257},
  doi          = {10.1109/MDAT.2015.2427257},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/journals/dt/ChouLYLKC15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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