BibTeX record conf/vts/XiangYC09

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@inproceedings{DBLP:conf/vts/XiangYC09,
  author       = {Dong Xiang and
                  Boxue Yin and
                  Kwang{-}Ting Cheng},
  title        = {Dynamic Test Compaction for Transition Faults in Broadside Scan Testing
                  Based on an Influence Cone Measure},
  booktitle    = {27th {IEEE} {VLSI} Test Symposium, {VTS} 2009, May 3-7, 2009, Santa
                  Cruz, California, {USA}},
  pages        = {251--256},
  publisher    = {{IEEE} Computer Society},
  year         = {2009},
  url          = {https://doi.org/10.1109/VTS.2009.14},
  doi          = {10.1109/VTS.2009.14},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/XiangYC09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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