BibTeX record conf/vts/ValleroTGC18

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@inproceedings{DBLP:conf/vts/ValleroTGC18,
  author       = {Alessandro Vallero and
                  Sotiris Tselonis and
                  Dimitris Gizopoulos and
                  Stefano Di Carlo},
  title        = {Multi-faceted microarchitecture level reliability characterization
                  for {NVIDIA} and {AMD} GPUs},
  booktitle    = {36th {IEEE} {VLSI} Test Symposium, {VTS} 2018, San Francisco, CA,
                  USA, April 22-25, 2018},
  pages        = {1--6},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/VTS.2018.8368665},
  doi          = {10.1109/VTS.2018.8368665},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/ValleroTGC18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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