BibTeX record conf/vts/SantosSTT95

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@inproceedings{DBLP:conf/vts/SantosSTT95,
  author       = {Marcelino B. Santos and
                  M. Sim{\~{o}}es and
                  Isabel C. Teixeira and
                  Jo{\~{a}}o Paulo Teixeira},
  title        = {Test preparation for high coverage of physical defects in {CMOS} digital
                  ICs},
  booktitle    = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
                  Princeton, New Jersey, {USA}},
  pages        = {330--337},
  publisher    = {{IEEE} Computer Society},
  year         = {1995},
  url          = {https://doi.org/10.1109/VTEST.1995.512657},
  doi          = {10.1109/VTEST.1995.512657},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/SantosSTT95.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}