BibTeX record conf/vts/RiusF95

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@inproceedings{DBLP:conf/vts/RiusF95,
  author    = {Josep Rius and
               Joan Figueras},
  title     = {Detecting I/sub {DDQ/} defective {CMOS} circuits by depowering},
  booktitle = {13th {IEEE} {VLSI} Test Symposium (VTS'95), April 30 - May 3, 1995,
               Princeton, New Jersey, {USA}},
  pages     = {324--329},
  publisher = {{IEEE} Computer Society},
  year      = {1995},
  url       = {https://doi.org/10.1109/VTEST.1995.512656},
  doi       = {10.1109/VTEST.1995.512656},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/RiusF95.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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