BibTeX record conf/vts/MadgeRCD02

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@inproceedings{DBLP:conf/vts/MadgeRCD02,
  author       = {Robert Madge and
                  Manu Rehani and
                  Kevin Cota and
                  W. Robert Daasch},
  title        = {Statistical Post-Processing at Wafersort - An Alternative to Burn-in
                  and a Manufacturable Solution to Test Limit Setting for Sub-micron
                  Technologies},
  booktitle    = {20th {IEEE} {VLSI} Test Symposium {(VTS} 2002), Without Testing It's
                  a Gamble, 28 April - 2 May 2002, Monterey, CA, {USA}},
  pages        = {69--74},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/VTS.2002.1011113},
  doi          = {10.1109/VTS.2002.1011113},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/MadgeRCD02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}