BibTeX record conf/vts/LinLC05

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@inproceedings{DBLP:conf/vts/LinLC05,
  author       = {Yung{-}Chieh Lin and
                  Feng Lu and
                  Kwang{-}Ting Cheng},
  title        = {Pseudo-Functional Scan-based {BIST} for Delay Fault},
  booktitle    = {23rd {IEEE} {VLSI} Test Symposium {(VTS} 2005), 1-5 May 2005, Palm
                  Springs, CA, {USA}},
  pages        = {229--234},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/VTS.2005.69},
  doi          = {10.1109/VTS.2005.69},
  timestamp    = {Fri, 24 Mar 2023 00:04:04 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LinLC05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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