BibTeX record conf/vts/LiLQSW03

download as .bib file

@inproceedings{DBLP:conf/vts/LiLQSW03,
  author       = {Zhuo Li and
                  Xiang Lu and
                  Wangqi Qiu and
                  Weiping Shi and
                  D. M. H. Walker},
  title        = {A Circuit Level Fault Model for Resistive Opens and Bridges},
  booktitle    = {21st {IEEE} {VLSI} Test Symposium {(VTS} 2003), 27 April - 1 May 2003,
                  Napa Valley, CA, {USA}},
  pages        = {379--384},
  publisher    = {{IEEE} Computer Society},
  year         = {2003},
  url          = {https://doi.org/10.1109/VTEST.2003.1197678},
  doi          = {10.1109/VTEST.2003.1197678},
  timestamp    = {Fri, 24 Mar 2023 00:04:05 +0100},
  biburl       = {https://dblp.org/rec/conf/vts/LiLQSW03.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.