BibTeX record conf/vts/HuangLCKCW11

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@inproceedings{DBLP:conf/vts/HuangLCKCW11,
  author       = {Yu{-}Jen Huang and
                  Jin{-}Fu Li and
                  Ji{-}Jan Chen and
                  Ding{-}Ming Kwai and
                  Yung{-}Fa Chou and
                  Cheng{-}Wen Wu},
  title        = {A built-in self-test scheme for the post-bond test of TSVs in 3D ICs},
  booktitle    = {29th {IEEE} {VLSI} Test Symposium, {VTS} 2011, May 1-5, 2011, Dana
                  Point, California, {USA}},
  pages        = {20--25},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/VTS.2011.5783749},
  doi          = {10.1109/VTS.2011.5783749},
  timestamp    = {Tue, 17 Oct 2023 15:22:33 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/HuangLCKCW11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}