BibTeX record conf/vts/ChenGB97

download as .bib file

@inproceedings{DBLP:conf/vts/ChenGB97,
  author       = {Liang{-}Chi Chen and
                  Sandeep K. Gupta and
                  Melvin A. Breuer},
  title        = {High Quality Robust Tests for Path Delay Faults},
  booktitle    = {15th {IEEE} {VLSI} Test Symposium (VTS'97), April 27-May 1, 1997,
                  Monterey, California, {USA}},
  pages        = {88--93},
  publisher    = {{IEEE} Computer Society},
  year         = {1997},
  url          = {https://doi.org/10.1109/VTEST.1997.599447},
  doi          = {10.1109/VTEST.1997.599447},
  timestamp    = {Thu, 21 Sep 2023 10:09:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/ChenGB97.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.